EVERLIGHT ELECTRONICS CO.,LTD.
Technical Data Sheet
0.56" Quadruple Digit Displays
ELF-511SYGWA/S530-E2
█ Reliability test items and conditions:
The reliability of products shall be satisfied with items l
isted below.
Confidence level:97%
LTPD:3%
NO Item Test Conditions
Test
Hours/Cycle
Sample Size
Failure
Judgment
Criteria
Ac/Re
1 Solder Heat TEMP : 260℃ ±
5 ℃ 5 SEC 76 PCS 0/1
H : +85℃ 30min
2 Temperature Cycle ∫ 5 min 50 CYCLE 76 PCS 0/1
L : -55℃ 30min
H : +100℃ 5min
3 Thermal Shock ∫ 10 sec 50 CYCLE 76 PCS 0/1Iv≦Ivt*0.5
L : -10℃ 5min
4 High Temperature Storage TEMP : 100℃ 1000 HRS 76 PCS 0/1Vf≧Uor
5 Low Temperature Storage TEMP : -55℃ 1000 HRS 76 PCS 0/1
6 DC Operating Life IF = 10 mA 1000 HRS 76 PCS 0/1
7
High Temperature / High
Humidity
85℃/85% RH 1000 HRS 76 PCS 0/1
Note: Ivt:The test Iv value of the chip before the reliablility
test
Iv:The test value of the chip that has completed the reliablility test
U:Upper Specification Limit
L: Lower Specification Limit
http : //www.everlight.com Rev. : 2 Page: 5 of 6
Device Number :CDDF-511-017 Prepared date:2006/11/6 Prepared by:
YanLi Zhong
or
Vf≦L
EVERLIGHT ELECTRONICS CO.,LTD.
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